Plant Pathol J > Volume 25(4); 2009 > Article
The Plant Pathology Journal 2009;25(4):303-316.
DOI: https://doi.org/10.5423/PPJ.2009.25.4.303    Published online December 31, 2009.
Determination of Genetic Divergence Based on DNA Markers Amongst Monosporidial Strains Derived from Fungal Isolates of Karnal Bunt of Wheat
J. M. Seneviratne, Atul K. Gupta, Dinesh Pandey, Indu Sharma, Anil Kumar
Abstract
Genetic variation among the base isolates and monosporidial strains derived from these isolates of Tilletia indica- the causal agent of Karnal bunt (KB) in wheat, was analyzed by morphological, growth behaviors and RAPD-ISSR based molecular polymorphism. Genetic make up of fungal cultures vary among each other. The magnitude of variation in KBPN group is less (narrow genetic base) when compared to the other groups KB3, KB9 and JK (broad genetic base) reflecting that variability is a genetically governed process. The generation of new variation with different growth characteristics is not a generalized feature and is totally dependant on the original genetic make-up of the base isolate generating new monosporidial strains. Thus, it can be concluded that monosporidial strains derived from mono-teliosporic isolate, consists of genetically heterogeneous population. The morphological and genetic variability further suggests that the variation in T. indica strains is predominantly derived through the genetic rearrangements through para sexual means.
Key Words: DNA polymorphism, fungal variability, genetic divergence, ISSR, RAPD
TOOLS
METRICS Graph View
  • 10 Crossref
  •  0 Scopus
  • 667 View
  • 1 Download
Related articles


ABOUT
BROWSE ARTICLES
EDITORIAL POLICY
FOR CONTRIBUTORS
Editorial Office
Rm,904 (New Bldg.) The Korean Science & Technology Center 22,
Teheran-ro 7-Gil, Gangnamgu, Seoul 06130, Korea
Tel: +82-2-557-9360    Fax: +82-2-557-9361    E-mail: paper@kspp.org                

Copyright © 2024 by Korean Society of Plant Pathology.

Developed in M2PI

Close layer
prev next